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1

[IEEE 2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05) - Taipei, Taiwan (03-05 Aug. 2005)] 2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05) - A Systematic Approach to Reducing Semiconductor Memory Test Time in Mass Production

Jen-Chieh Yeh,, Shyr-Fen Kuo,, Cheng-Wen Wu,, Chih-Tsun Huang,, Chao-Hsun Chen,

Year:

2005

Language:

english

File:

PDF, 146 KB

english, 2005

2

Micromechanics of nonlinear behavior in solid-filled Mooney-Rivlin rubber specimen

Chen, Chao-Hsun, Wu, Chien-Heng, Wang, Yuh-Chang, Cheng, Chiang-Ho

Journal:

Journal of Propulsion and Power

Year:

1996

Language:

english

File:

PDF, 416 KB

english, 1996

3

Internal stresses and microstructures of commercial thick diamond films deposited by different deposition methods

Cheng-Tzu Kuo, Jin-Yu Wu, Chao-Hsun Lin, Tien-Rong Lu, Chien-Min Sung

Journal:

Materials Chemistry and Physics

Year:

2001

Language:

english

File:

PDF, 490 KB

english, 2001

4

Built-In Self-Repair Schemes for Flash Memories

Yu-Ying Hsiao, Chao-Hsun Chen, Cheng-Wen Wu

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2010

Language:

english

File:

PDF, 6.49 MB

english, 2010

5

Economic Aspects of Memory Built-in Self-Repair

Rei-Fu Huang, Chen Chao-Hsun, Wu Cheng-Wen

Journal:

IEEE Design & Test of Computers

Year:

2007

Language:

english

File:

PDF, 1.07 MB

english, 2007

6

A Systematic Approach to Memory Test Time Reduction

Jen-Chieh Yeh, Chao-Hsun Chen, Cheng-Wen Wu, Shuo-Fen Kuo

Journal:

IEEE Design & Test of Computers

Year:

2008

Language:

english

File:

PDF, 813 KB

english, 2008

7

Economic Analysis of the HOY Wireless Test Methodology

YuTsao Hsing, LiMing Denq, Chao-Hsun Chen, Cheng-Wen Wu

Journal:

IEEE Design & Test of Computers

Year:

2010

Language:

english

File:

PDF, 950 KB

english, 2010

8

Lactic Acid Esterification on Titania–Silica Binary Oxides

Li, Kuo-Tseng, Tsai, Lung-Der, Wu, Chao-Hsun, Wang, Ikai

Journal:

Industrial & Engineering Chemistry Research

Year:

2013

Language:

english

File:

PDF, 588 KB

english, 2013

9

Internal transcribed spacer sequence-based identification and phylogenic relationship of I-Tiao-Gung originating from Flemingia and Glycine (Leguminosae) in Taiwan

Wu, Chin-Tung, Hsieh, Chang-Chi, Lin, Wen-Chuan, Tang, Chuan-Yi, Yang, Chao-Hsun, Huang, Yu-Chun, Ko, Yu-Jen

Journal:

Journal of Food and Drug Analysis

Year:

2013

Language:

english

File:

PDF, 1.36 MB

english, 2013

10

[IEEE 24th IEEE VLSI Test Symposium - Berkeley, CA, USA (30-04 April 2006)] 24th IEEE VLSI Test Symposium - A Built-In Self-Repair Scheme for NOR-Type Flash Memory

Yu-Ying Hsiao,, Chao-Hsun Chen,, Cheng-Wen Wu,

Year:

2006

Language:

english

File:

PDF, 299 KB

english, 2006

11

[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - An Enhanced EDAC Methodology for Low Power PSRAM

Chen, Po-yuan, Yeh, Yi-ting, Chen, Chao-hsun, Yeh, Jen-chieh, Wu, Cheng-wen, Lee, Jeng-shen, Lin, Yu-chang

Year:

2006

Language:

english

File:

PDF, 11.18 MB

english, 2006

12

Generalization of an Enhanced ECC Methodology for Low Power PSRAM

Po-Yuan Chen,, Chin-Lung Su,, Chao-Hsun Chen,, Cheng-Wen Wu,

Journal:

IEEE Transactions on Computers

Year:

2013

Language:

english

File:

PDF, 1.67 MB

english, 2013

13

[IEEE 14th Asian Test Symposium (ATS'05) - Calcutta, India (2005.12.21-2005.12.21)] 14th Asian Test Symposium (ATS'05) - Flash Memory Die Sort by a Sample Classification Method

Dawn, Y.-C., Jen-Chieh Yeh,, Cheng-Wen Wu,, Chia-Ching Wang,, Yung-Chen Lin,, Chao-Hsun Chen,

Year:

2005

Language:

english

File:

PDF, 214 KB

english, 2005

14

[IEEE 2014 IEEE 23rd Asian Test Symposium (ATS) - Hangzhou, China (2014.11.16-2014.11.19)] 2014 IEEE 23rd Asian Test Symposium - BIST-Assisted Tuning Scheme for Minimizing IO-Channel Power of TSV-Based 3D DRAMs

Yu, Yun-Chao, Yang, Chi-Chun, Li, Jin-Fu, Lo, Chih-Yen, Chen, Chao-Hsun, Lai, Jenn-Shiang, Kwai, Ding-Ming, Chou, Yung-Fa, Wu, Cheng-Wen

Year:

2014

Language:

english

File:

PDF, 229 KB

english, 2014

15

Study on the Stability of DeoxyArbutin in an Anhydrous Emulsion Systemy

Lin, Chih-Chien, Yang, Chao-Hsun, Chang, Nai-Fang, Wu, Pey-Shiuan, Chen, Yi-Shyan, Lee, Shu-Mei, Chen, Chiu-Wen

Journal:

International Journal of Molecular Sciences

Year:

2011

Language:

english

File:

PDF, 507 KB

english, 2011

16

[IEEE 2015 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2015.4.27-2015.4.29)] VLSI Design, Automation and Test(VLSI-DAT) - A hybrid built-in self-test scheme for DRAMs

Yang, Chi-Chun, Li, Jin-Fu, Yu, Yun-Chao, Wu, Kuan-Te, Lo, Chih-Yen, Chen, Chao-Hsun, Lai, Jenn-Shiang, Kwai, Ding-Ming, Chou, Yung-Fa

Year:

2015

Language:

english

File:

PDF, 524 KB

english, 2015

17

Modification of lignin in sugarcane bagasse by a monocopper hydrogen peroxide-generating oxidase from Thermobifida fusca

Chen, Cheng-Yu, Lee, Cheng-Cheng, Chen, Hung-Shuan, Yang, Chao-Hsun, Wang, Shu-Ping, Wu, Jyh-Horng, Meng, Menghsiao

Journal:

Process Biochemistry

Year:

2016

Language:

english

File:

PDF, 1.21 MB

english, 2016

18

Wedge-Apex Crack in an Angularly Inhomogeneous Wedge

Wu, Chein H., Chen, Chao-Hsun

Journal:

Journal of Applied Mechanics

Year:

1989

Language:

english

File:

PDF, 1.02 MB

english, 1989

19

A Crack in a Confocal Elliptic Inhomogeneity Embedded in an Infinite Medium

Wu, Chien H., Chen, Chao-Hsun

Journal:

Journal of Applied Mechanics

Year:

1990

Language:

english

File:

PDF, 462 KB

english, 1990

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